Units are rejected that fall outside the standard distribution of that sample, even if those units fall within the limits of the full population. PAT is a methodology by which a distribution is generated for a production batch. Wafer level probe allows for an extra pass of testing in order to mitigate potential test escapes, and it also enables part average testing (PAT). Wafer Level Probe and Part Average Testing All such products are designated with a “W” following the base part number (for example, ADuM1401WSRWZ is the automotive grade equivalent of the ADuM1401ARWZ). In addition to those extra steps, all ADI production facilities employed in the production of iCoupler digital isolators are TS-16949 certified. Production test at multiple temperatures.These include the following steps taken, in addition to Analog Devices’ standard production flow: In our efforts to achieve 0 ppm defect rates for these applications, we take extra measures to limit defects in production. Today, many hybrid electric vehicles on the road use iCoupler digital isolators to monitor battery levels and to drive the efficient electric motor. Yet, for the demanding challenges in the automotive industry, an extra level of reliability and quality is required. Quality is assured through Analog Devices’ commitment to quality, as established through rigorous qualification and characterization processes. Analog Devices’ iCoupler ® digital isolators have demonstrated excellent reliability and quality, with over 750 million channels shipped to customers over the past 10 years.
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